AXRF-Q RF Sub-System for Semiconductor Test

发布时间：2025-5-2 9:23:0 加入购物车

AXRF-Q is a Multi-Port RF Subsystem for testing RF semi-conductor components.

Features

• Up to 32 bi-directional RF Test Ports
• Scalar & Vector Network Analysis
• Gain and Noise Figure measurement
• Wide Bandwidth Modulated Signal Generation and Analysis to 6 GHz
• Radio Communication Standards Personality Options
• Modular open architecture based on PXI/PXIe