The Wireless Test System (WTS) helps you to reduce manufacturing test time and accelerate test development to get product to market quickly.

A WTS solution offers a powerful combination of fast and industry-leading measurement speed, high port density, wide bandwidth and active integrated DUT switching.

Designed for high volume physical layer test in non-signaling test applications, the instrument provides test capabilities for testing multiple antennas, multiple DUTs in parallel and multi-channel RF requirements, such as MIMO or 802.11ac wave 2 & 3. This provides test coverage for all of today and tomorrows connectivity, cellular and internet of things standards.

Features

• Generate and receive RF signals from 65MHz to 6GHz with up to 200 MHz instantaneous bandwidth
• 8 or 16 full duplex RF ports that can be configured for MIMO, multi-standard and multi-DUT testing
• Chipset automation available
• Connectivity standards
  • 802.11a/b/g/n/ac 80+80 / 160
  • BT / BT LE
  • FM / RDS
  • GNSS
• Cellular standards
  • LTE / LTE-A
  • WCDMA / HSPA+
  • TD-SCDMA
  • CDMA2000
  • GSM / EDGE